Optimized slow light and beam profiles

POSTER

Abstract

We will present an overview of Electromagnetically Induced Transparency (EIT) and slow light dependence on transverse laser field profile. Idealized treatments typically assume a uniform optical field profile while experiments are typically performed with gaussian beam profiles. Here we present a comparison of EIT lineshapes measured with flat top and gaussian transverse profiles and compare slow light delays observed under such circumstances with those derived from measured EIT line shapes in simple models. Additionally we study the effects of differential AC Stark shifts due to transverse beam profiles and their effect on light storage.

Authors

  • Rita Kalra

    • Harvard-Smithsonian CfA

  • Mason Klein

    • Harvard-Smithsonian CfA
    • Harvard-Smithsonian Center for Astrophysics

  • Yanhong Xiao

    • Harvard-Smithsonian CfA
    • Harvard-Smithsonian Center for Astrophysics and Harvard University
    • Harvard-Smithsonian Center for Astrophysics

  • Michael Hohensee

    • Harvard-Smithsonian CfA

  • David F. Phillips

    • Harvard-Smithsonian CfA
    • Harvard-Smithsonian Center for Astrophysics and Harvard University

  • Ronald L. Walsworth

    • Harvard-Smithsonian CfA
    • Harvard-Smithsonian Center for Astrophysics and Harvard University
    • Harvard-Smithsonian Center for Astrophysics