Volumetric nanoscale strain visualization using Bragg x-ray coherent diffraction imaging
ORAL
Abstract
Nanoscopic strain engineering is an innovative pathway which holds great potential in functional device application [memory, photactive materials, sensors, diodes, etc.]. Therefore: volumetric imaging of strain at the nanoscale is important for understanding and designing these devices. In my presentation I will overview Bragg X-ray Coherent Diffractive Imaging (BCDI) of topological defects in ferroelectrics and ferroelectric devices in operando. Through this, the audience will be introduced to how BCDI can act as a liaison between theory, design, and application of the next generation of electronic devices.
*This work was supported by the US Department of Defense, Air Force Office of Scientific Research under Award No. FA9550-18-1-0196 (Program Manager: Dr. Ali Sayir). We also acknowledge support, in part from the LANSCE Professorship sponsored by the National Security Education Center at LANL under subcontract No. 257827. This research used resources of the Advanced Photon Source (APS), a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Argonne National Laboratory (ANL) under contract no. DE-AC02-06CH11357. We also thank the staff at ANL, LANL and the APS for their support.
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Presenters
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Elijah Schold
- New Mexico State Univ