Materials II: Semiconductors and Optical Characterization

Presentations

• Strain dependence of the band structure and critical points of pseudomorphic Ge$_{1-y}$Sn$_{y\, }$alloys on Ge

  ORAL

  Oct. 16, 2015, 12:50 PM – Oct. 16, 2015, 1:02 PM

  Authors

  • Nalin Fernando

    • New Mexico State University

  • Jaime Moya

    • New Mexico State University

  • Stefan Zollner

    • New Mexico State University

  • John Hart

    • University of Delaware

  • Dainan Zhang

    • University of Delaware

  • Ryan Hickey

    • University of Delaware

  • Ramsey Hazbun

    • University of Delaware

  • James Kolodzey

    • University of Delaware

  View abstract →

• Growth and Properties of Ge Thermal Oxides

  ORAL

  Oct. 16, 2015, 1:02 PM – Oct. 16, 2015, 1:14 PM

  Authors

  • T. Nathan Nunley

    • New Mexico State Univ

  • Nalin Fernando

    • New Mexico State Univ

  • Jaime Moya

    • New Mexico State Univ

  • Cayla M. Nelson

    • New Mexico State Univ

  • Stefan Zollner

    • New Mexico State Univ

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• Rutherford backscattering measurements of Bi mole fraction and site distribution in InAsBi

  ORAL

  Oct. 16, 2015, 1:14 PM – Oct. 16, 2015, 1:26 PM

  Authors

  • Arvind J. Shalindar

    • Arizona State University

  • Preston T. Webster

    • Arizona State University

  • Barry J. Wilkens

    • Arizona State University

  • Terry L. Alford

    • Arizona State University

  • Shane R. Johnson

    • Arizona State University

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• Electronic states of plasma-enhanced atomic layer deposited SiO2 on GaN

  ORAL

  Oct. 16, 2015, 1:26 PM – Oct. 16, 2015, 1:38 PM

  Authors

  • Brianna Eller

    • Arizona State University

  • Wenwen Li

    • Arizona State University

  • Sarah Rupprecht

    • Arizona State University

  • Srabanti Chowdhury

    • Arizona State University

  • Robert Nemanich

    • Arizona State University

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• How thick is my film?

  COFFEE_KLATCH · Invited

  Oct. 16, 2015, 1:38 PM – Oct. 16, 2015, 2:02 PM

  Authors

  • Stefan Zollner

    • New Mexico State Univ

  View abstract →